78885605
May 17, 2006
Oct 2, 2007
Probes for testing semiconductors; probe cards for testing semiconductors; semiconductor testing apparatus, namely, machines for testing the performance of semiconductors; print circuit boards; integrated circuits; memory cards; blank smart cards; electrical connectors; optical connectors; integrated circuit sockets; electrical plugs; measuring and testing apparatus, namely, machines for testing the performance of flat panel displays; densimeters; visometers; electric cables; telecommunication cables
Electrical and Scientific Apparatus