85693683
Aug 2, 2012
Dec 15, 2015
computer hardware for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for use in process control and yield management for the semiconductor, integrated circuits and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools
Electrical and Scientific Apparatus