XENOCS XSACT
Mark Identification

XENOCS XSACT

Serial Number

88372785

Filing Date

Apr 5, 2019

Registration Date

Apr 7, 2020

Trademark by

XENOCS SAS

Active Trademark

Classification Information

Downloadable and recorded software for analyzing and identifying nanostructures, in particular size, configuration and orientation, or atomic-scale structures of soft matter or nanostructured materials, in particular polymers, surfactants, colloids, nanomaterials, porous materials, liquid crystals; Downloadable and recorded software for identifying characteristic dimensions on the atomic scale, the nanoscale or the mesoscale based on material analysis by means of small-angle X-ray scattering, ultra-small-angle X-ray scattering or wide-angle X-ray scattering; Downloadable and recorded software for processing X-ray scattering data collected by means of analyzing small-angle X-ray scattering, ultra-small-angle X-ray scattering or wide-angle X-ray scattering, and for visualizing data; Downloadable and recorded software for providing information relating to the size distribution of nanoparticles, relating to the size and configuration of nano-objects or nanoparticles in nanostructured materials, relating to fractal dimensions, relating to the crystalline proportion of semi-crystalline materials; Downloadable and recorded software for analyzing crystalline phases, nanoscale coatings for macromolecules in solutions, including proteins; Downloadable and recorded software for analyzing the orientation of nanostructures in thin films or deformed or stressed materials

Electrical and Scientific Apparatus