XENOCS

(Based on 44(d) Priority Application) Measuring apparatus and instruments, namely X-ray apparatus not for medical purposes in the nature of x-ray radiography instruments, x-ray imaging instruments, x-ray scattering instruments; Scientific apparatus and instruments, namely, X-ray apparatus not for medical purposes in the nature of X-ray radiography instruments, X-ray imaging instruments, x-ray scattering instruments, for examining material structures and particle size analysis; Sensors for measuring distance to an object, not for medical use; Laboratory apparatus and instruments, namely, X-ray apparatus not for medical purposes, optical time-domain reflectometers, X-ray imaging modules for X-ray apparatus not for medical purposes in the nature of X-ray scattering measurements, X-ray apparatus not for medical purposes in the nature of X-ray radiography instruments and X-ray imaging apparatus; Measuring, regulating and testing apparatus, namely, x-ray fluorescence analyzers, other than for medical purposes, used for analyzing crystalline structure of nanomaterials and for examining nanoscale properties of materials such as shape and size of structures and for analysis of the macrostructure of materials; Display and checking (supervision) apparatus; Apparatus and instruments for industrial process monitoring and control, namely, X-ray apparatus not for medical purposes in the nature of X-ray scattering instruments; downloadable software for scientific applications, materials research, and/or for modelling the structure of nanomaterials and computer hardware; Measuring, detecting and monitoring instruments, indicators and controllers, namely, X-ray imaging instruments for materials research, small angle X-ray scattering instruments and wide angle X-ray scattering instruments; Optical devices, enhancers and correctors, namely, spectrometers; Scientific research and laboratory apparatus, educational apparatus and simulators, namely, X-ray apparatus, not for medical purposes; Radiological apparatus for industrial purposes, namely, X-ray imaging instruments for materials research, small angle X-ray scattering instruments and wide angle X-ray scattering instruments; X-ray analyzers, other than for medical purposes, used for analyzing crystalline structure of nanomaterials and for examining nanoscale properties of materials such as shape and size of structures; X-ray imaging instruments, small angle and wide angle X-ray scattering instruments used separately or in combination for examining crystal properties for materials research and development or for analyzing the shape, sizes, molecular weight, interactions, aggregation and conformational state of proteins, RNA or biological macromolecules in solution; Particle detecting apparatus, namely, X-ray scattering instruments for measuring nanoscale particle size analysis in the field of nanomaterials, polymers, soft matter, colloids, complex fluids, liquid crystals, protein solutions and thin nanostructured films; X-ray detection apparatus, visible light detection apparatus, infrared detection apparatus and UV detection apparatus; Electronic sensors; Electro-optical sensors; Interfaces for detectors; Magnetic object detectors; Optical sensors; X-ray imaging instruments for materials research, small angle and wide angle X-ray scattering instruments for measuring nanoscale particle sizes and particle size analysis; Photoelectric sensors; Photoionic detectors; Measuring devices, electric, namely, clamp meters for measuring electricity; Instruments for surveying physical data; Radiation-measuring instruments; optical time-domain reflectometers; Scientific apparatus, namely, spectrometers; Data processing equipment, namely, computers; Computer software, in particular for scientific applications, in particular for structure modelling of nanomaterials; X-ray producing apparatus and installations, not for medical purposes; Radiological apparatus for industrial purposes; X-ray analysers, other than for medical purposes; structural and replacement parts and fittings for all the aforesaid goods; (Based on 44(e)) ; Measuring apparatus and instruments, namely X-ray apparatus not for medical purposes in the nature of x-ray radiography instruments, x-ray imaging instruments, x-ray scattering instruments; Scientific apparatus and instruments, namely, X-ray apparatus not for medical purposes in the nature of X-ray radiography instruments, X-ray imaging instruments, x-ray scattering instruments, for examining material structures and particle size analysis; Sensors for measuring distance to an object, not for medical use; Laboratory apparatus and instruments, namely, X-ray apparatus not for medical purposes, optical time-domain reflectometers, X-ray imaging modules for X-ray apparatus not for medical purposes in the nature of X-ray scattering measurements, X-ray apparatus not for medical purposes in the nature of X-ray radiography instruments and X-ray imaging apparatus; Measuring, regulating and testing apparatus, namely, x-ray fluorescence analyzers, other than for medical purposes, used for analyzing crystalline structure of nanomaterials and for examining nanoscale properties of materials such as shape and size of structures and for analysis of the macrostructure of materials; Display and checking (supervision) apparatus; Apparatus and instruments for industrial process monitoring and control, namely, X-ray apparatus not for medical purposes in the nature of X-ray scattering instruments; downloadable software for scientific applications, materials research, and/or for modelling the structure of nanomaterials and computer hardware; Measuring, detecting and monitoring instruments, indicators and controllers, namely, X-ray imaging instruments for materials research, small angle X-ray scattering instruments and wide angle X-ray scattering instruments; Optical devices, enhancers and correctors, namely, spectrometers; Scientific research and laboratory apparatus, educational apparatus and simulators, namely, X-ray apparatus, not for medical purposes; Radiological apparatus for industrial purposes, namely, X-ray imaging instruments for materials research, small angle X-ray scattering instruments and wide angle X-ray scattering instruments; X-ray analyzers, other than for medical purposes, used for analyzing crystalline structure of nanomaterials and for examining nanoscale properties of materials such as shape and size of structures; X-ray imaging instruments, small angle and wide angle X-ray scattering instruments used separately or in combination for examining crystal properties for materials research and development or for analyzing the shape, sizes, molecular weight, interactions, aggregation and conformational state of proteins, RNA or biological macromolecules in solution; Particle detecting apparatus, namely, X-ray scattering instruments for measuring nanoscale particle size analysis in the field of nanomaterials, polymers, soft matter, colloids, complex fluids, liquid crystals, protein solutions and thin nanostructured films; X-ray detection apparatus, visible light detection apparatus, infrared detection apparatus and UV detection apparatus; Electronic sensors; Electro-optical sensors; Interfaces for detectors; Magnetic object detectors; Optical sensors; X-ray imaging instruments for materials research, small angle and wide angle X-ray scattering instruments for measuring nanoscale particle sizes and particle size analysis; Photoelectric sensors; Photoionic detectors; Measuring devices, electric, namely, clamp meters for measuring electricity; Instruments for surveying physical data; Radiation-measuring instruments; optical time-domain reflectometers; Scientific apparatus, namely, spectrometers; Data processing equipment, namely, computers; Computer software, in particular for scientific applications, in particular for structure modelling of nanomaterials; X-ray producing apparatus and installations, not for medical purposes; Radiological apparatus for industrial purposes; X-ray analysers, other than for medical purposes; structural and replacement parts and fittings for all the aforesaid goods

(Based on 44(d) Priority Application) Advisory services relating to science, namely, scientific research consulting; Advisory services relating to scientific instruments, namely, product development consultation; scientific analytical laboratory services; Calibration of instruments; Professional consultancy relating to technology; Industrial research; Scientific analytical laboratory services; Leasing of scientific instruments, namely, rental of laboratory apparatus and instruments; Rental of measuring apparatus; Preparation of project analysis studies and analysis, namely, scientific research; scientific research consulting, namely, preparation of reports relating to scientific research; Preparation of technical manuals, namely, scientific research; Providing science technology information; Provision of scientific information; product research and development services; product research in instrumentation; product research in measurement technology; Scientific research consulting; scientific and technological research services, namely, scientific research, analysis, testing; rental and leasing in relation to the aforesaid services, namely, rental of laboratory apparatus and instruments and rental of measuring apparatus; Consultancy and information in relation to the aforesaid services; all the aforesaid services in particular relating to, X-ray imaging for materials research, or X-ray scattering for examining material structures and crystal properties; the fields of nanomaterials, polymers, soft matter, colloids, complex fluids, liquid crystals, protein solutions, thin nanostructured films, and particle size analysis; materials research, development and production control in the fields of polymers, nanocomposites, biomaterials, alloys; analysis of the macrostructure; detection of structural inhomogeneities, defects, voids, pores, aggregations, interfaces in materials; (Based on 44(e)) ; Advisory services relating to science, namely, scientific research consulting; Advisory services relating to scientific instruments, namely, product development consultation; scientific analytical laboratory services; Calibration of instruments; Professional consultancy relating to technology; Industrial research; Scientific analytical laboratory services; Leasing of scientific instruments, namely, rental of laboratory apparatus and instruments; Rental of measuring apparatus; Preparation of project analysis studies and analysis, namely, scientific research; scientific research consulting, namely, preparation of reports relating to scientific research; Preparation of technical manuals, namely, scientific research; Providing science technology information; Provision of scientific information; product research and development services; product research in instrumentation; product research in measurement technology; Scientific research consulting; scientific and technological research services, namely, scientific research, analysis, testing; rental and leasing in relation to the aforesaid services, namely, rental of laboratory apparatus and instruments and rental of measuring apparatus; Consultancy and information in relation to the aforesaid services; all the aforesaid services in particular relating to, X-ray imaging for materials research, or X-ray scattering for examining material structures and crystal properties; the fields of nanomaterials, polymers, soft matter, colloids, complex fluids, liquid crystals, protein solutions, thin nanostructured films, and particle size analysis; materials research, development and production control in the fields of polymers, nanocomposites, biomaterials, alloys; analysis of the macrostructure; detection of structural inhomogeneities, defects, voids, pores, aggregations, interfaces in materials