XDVM

Scientific, electrical, optical monitoring and measuring instruments, namely, coating thickness measurement instruments, [electrical conductivity measurement instruments, microhardness measuring instruments, porosity measuring instruments], instruments for measuring thickness of coatings, alloy compositions, material analysis, [porosity, electrical conductivity,] ferrite content, [ micro-hardness,] and other properties of coatings and layers;[ magneto,-opto, -and electronic data recording media, namely, blank magnetic computer tapes and floppy discs; ] computers and data processors for use in the aforementioned scientific, electrical, optical monitoring and measuring instruments; thickness measurement instruments that use ultra sound and electromagnetic radiation for measurement of diffraction, refraction, absorption, luminescence, scattering and reflection phenomena to determine the layer thicknesses of metal for measurement; X-ray detectors; X-ray tubes not for medical purposes; computer software for use in controlling the scientific, electrical, optical and monitoring parameters of measuring instruments and to analyze and evaluate, transmit and process the results

training in the use and operation of scientific, electrical, optical monitoring and measuring instruments and computers and software used therein; providing on-line training via a global computer network in the use and operation of scientific, electrical monitoring and measuring instruments and computers and software used therein

product development for others; computer software consultation for others; technical consultation in the field of scientific, electrical, optical monitoring and measuring apparatuses and instruments and computers and software used therein; providing on-line consultation via a global computer network in the field of software used therein; computer services, namely, designing and implementing web sites for others