XAN

Scientific, electrical, optical, monitoring and measuring instruments, namely, instruments for measuring the thickness of layers by electromagnetic radiation, optical instruments for measuring the diffraction, refraction, absorption, luminescence, scattering, and reflection phenomena for the determination of layer thickness, coating thickness measurement instruments, [ electrical conductivity measurement instrument, micro hardness measuring instruments, porosity measuring instruments, ] instruments for measuring thickness of coatings, alloy composition, material analysis, [ porosity, electrical conductivity, ferrite content, microhardness, and other properties of coatings and layers; magneto-, opto-electronic data recording media, namely, blank magnetic computer tapes and floppy discs; ] electromagnetic radiation detectors; spectrometers, namely, X-ray fluorescence spectrometers; semiconductors detectors, color video cameras, X-ray detectors; X-ray tubes for scientific laboratory purposes, data processors; computers; computer software for use in controlling the scientific, electrical, optical, and monitoring parameters of measuring instruments and to analysis and evaluate, transmit and process the results

Training in the use and operation of scientific, electrical and optical monitoring and measuring instruments, computers and software used therewith; providing online training via a global computer network in the use and operation of scientific, electrical and optical monitoring and measuring instruments and computers and software used therein

Product development for others; computer consultation for others; technical consultation in the field of scientific, electrical, optical, monitoring and measuring apparatuses and instruments and computers and software used therein; providing online consultation via a global computer network in the field of scientific, electrical, optical monitoring and measuring instruments and computers and software used therein; computer services, namely designing and implementing web sites for others; Consulting and product development surfaces in the field of upgrading computers and software applications, regarding transmission and reproduction of sound, image, magneto-, opto-, electronic data, layer thickness measuring, x-ray fluorescence, semi-conductivity, electromagnetic radiation and statistical evaluation of data