78105464
Jan 29, 2002
Aug 26, 2003
Active Trademark
Test probe electrical contacts and holders therefor, for probing integrated circuits, semiconductor devices and specialty electronic devices, namely, ASICS, DSPs, LEDs and MEMs; electrical testing equipment, namely, probe cards, probe card interfaces, and fixtures in the nature of probers, manipulators, needle holder assemblies, computer assisted probes and edge sensors used to facilitate testing of integrated circuits
Electrical and Scientific Apparatus