88071817
Aug 9, 2018
Jan 7, 2020
Active Trademark
probes for testing integrated circuits; test pins for testing circuit boards; probes for testing semiconductors; probe cards for use in connection with inspection of semiconductors and liquid crystal display panels; probe cards for testing semiconductor wafers; testing apparatus for testing circuit boards; testing apparatus for testing integrated circuits; testing apparatus for testing semiconductors; software for performing radiofrequency or RF calibration; computer software for driving probe card; computer software for testing semiconductor devices; probes for testing the radiofrequency or RF of semiconductors
Electrical and Scientific Apparatus