79071742
May 5, 2009
Jul 27, 2010
Downloadable computer programs and software, used in the field of metrology of silicon wafers for 3D visualization and data analysis and processing of readings
Electrical and Scientific ApparatusDesign and development of computer software, used in the field of metrology of silicon wafers for 3D visualization and data analysis and processing of readings; installation, maintenance and updating of computer software in the field of metrology of silicon wafers for 3D visualization and data analysis and processing of readings
Computer and Scientific