WAFERSTUDIO
Mark Identification

WAFERSTUDIO

Serial Number

79071742

Filing Date

May 5, 2009

Registration Date

Jul 27, 2010

Trademark by

E+H METROLOGY GMBH

Classification Information

Downloadable computer programs and software, used in the field of metrology of silicon wafers for 3D visualization and data analysis and processing of readings

Electrical and Scientific Apparatus

Design and development of computer software, used in the field of metrology of silicon wafers for 3D visualization and data analysis and processing of readings; installation, maintenance and updating of computer software in the field of metrology of silicon wafers for 3D visualization and data analysis and processing of readings

Computer and Scientific