88901359
May 5, 2020
Downloadable and prerecorded computer software for detecting and classifying wafer signatures and defects for semiconductor manufacturers to make process adjustments to maximize wafer and semiconductor yield; downloadable and prerecorded computer software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, and wafers; downloadable and prerecorded computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries
Electrical and Scientific Apparatus