88285787
Feb 1, 2019
Aug 20, 2019
Active Trademark
Inspection system comprised of a laser, recorded computer software, and computer hardware for testing, inspecting, and characterizing physical properties of semiconductor wafers and integrated circuits, namely, critical defects; instruments for testing, inspecting, and characterizing physical properties of semiconductor wafers and integrated circuits, namely, critical defects; computer hardware and recorded software used for testing, inspecting, and characterizing physical properties of semiconductor wafers and integrated circuits, namely, critical defects; all of the aforesaid not including any software relating to or connected with managing real estate, property management, property construction and development and performing of related accounting functions
Electrical and Scientific Apparatus