87590610
Aug 30, 2017
Oct 23, 2018
KABUSHIKI KAISHA NIHON MICRONICS
Active Trademark
Instruments for use in electrical testing machines for testing semiconductors; electrical testing machines for testing semiconductors; probes for testing semiconductors; probes for testing integrated circuits; semiconductor testing apparatus; measuring or testing instruments for use in inspection of semiconductors; electrical testing machines for use in inspecting semiconductor substrates; measuring instruments for electric and magnetic materials, namely, electric and magnetic measuring instruments
Electrical and Scientific Apparatus