UNISERS

Machines for processing, coating and testing semiconductor wafers and semiconductors; mechanical machine tools for processing, coating and testing semiconductor wafers and semiconductors

Recorded software for the analysis of semiconductor wafers; Recorded software for the detection and analysis of defects on semiconductor wafers; Recorded software for the detection and analysis of nanoparticles on surfaces and in fluids; test equipment for semiconductor wafers and semiconductors, namely, semiconductor wafer and semiconductor testing apparatus; surface inspection equipment, namely, surface optical scanner; measuring equipment and instruments, namely, optical microscopy measuring apparatus; precision measuring instruments, namely, nanoparticles measuring apparatus; measuring instruments other than for medical use, namely, semiconductor sensors; semiconductors; semiconductor wafers; semiconductor memory devices; semiconductor memory units in the nature of memory modules; semiconductor optical amplifiers; quantum dots being semiconductor structures, namely, crystalline semi-conductor material; electronic integrated circuits; electronic measurement devices for particle size analysis of nanoparticles

Chemical analysis and chemical research services; Chemical laboratory services; chemical analysis; scientific and technological services, namely, scientific research, testing and analysis services in the field of semiconductor industry; industrial research in the field of semiconductor industry; industrial testing and analysis services, namely, detection and analysis of nanoparticles on surfaces and fluids; technical testing services, namely, testing, analysis, and evaluation of surfaces and fluids to assure compliance with industry standards; quality control services for others; authentication services in the field of semiconductor industry; computer and software design and development; scientific and technological services and related research and development services, namely, detection and analysis of nanoparticles on surfaces and in fluids; sampling and analysis services to determine the presence of contamination, namely, detection of contaminants on surfaces and in fluids; product testing services for semiconductor wafers and semiconductors for electrical engineering devices; scientific consulting services; technical consulting services in the field of detection and analysis of nanoparticles on surfaces and in fluids