UNANO

Scientific, electrical and measuring apparatus and instruments for determining and analyzing physical properties of materials, namely, for testing and performing measurements on solids and thin films to determine physical and mechanical properties for hardness, fracture toughness, hardness, strain-rate sensitivity, creep, stress relaxation, adhesion, interfacial friction, yield strength, residual stress, fracture toughness, and bonding; computer hardware and downloadable and prerecorded software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, and wafers; electrical and scientific instruments for testing, inspecting, and characterizing physical properties of semiconductors, integrated circuits, microelectronics, and wafers