TREC

scanning probe microscope (SPM) probe derivatization kits, consisting primarily of chemical reagents and chemical crosslinking reagents used to attach a biological or chemical sensor to AFM cantilever tips for scientific or research use

topography and recognition imaging atomic force microscope (AFM) and microprocessor, controller, amplifier, laser, piezoelectric transducer and position sensitive detector used to chart variations in the topography of a sample and the presence of chemical or biological agents on the surface of a sample all for use with atomic force microscopes