TESPINE

Semiconductor wafer inspection apparatus, namely, inspection machines for electrical or optical inspection of semiconductor wafers; Apparatus for inspection, namely, electrical or optical inspection apparatus for of semiconductor materials, namely, semiconductor wafers, semiconductor devices and semiconductor die; downloadable computer software for use in inspecting semiconductor wafers; recorded computer software for use in inspecting semiconductor wafers; downloadable computer software for use in testing and inspecting semiconductor materials, namely, semiconductor wafers, semiconductor devices and semiconductor die; recorded computer software for use in testing and inspecting semiconductor materials, namely, semiconductor wafers, semiconductor devices and semiconductor die