TEMIC

Optical apparatus and instruments, namely, electron microscopes; Hardware, namely, electronic and optical apparatus for use in inspection and measurement of semiconductor materials, equipment parts, industrial components, liquid-suspended particles, foods and drugs, and biological samples in particular for microscopic examination and quality control purposes; Electric and electronic apparatus and instruments, namely, for microscopic examination; Microscopes, electron microscopes and scanning electron microscopes; parts and fittings for all the aforesaid goods, namely, sample holders, lenses, lighting devices for microscopes; Scientific and laboratory research apparatus, teaching apparatus and simulators, namely, vacuum chambers with precision mechanical stages and electron optical lenses, control software, programs and software applications for the analysis of data generated by the electron-detectors of the microscopes, electron microscopes and scanning electron microscopes; Adapters for adapting a camera to a microscope; Electron microscopes; Scientific apparatus, namely, spectrometers and parts and fittings therefor; Mass spectrometers in the nature of scientific apparatus; Semiconductor objectives; Condensers for microscopes; Co-observation attachment in the nature of a lens, a detector, a specimen holder, an environmental temperature/humidity controller, an in-situ specimen manipulator, and a pretreatment device for microscope; Spectrometers, namely, X-Ray spectrometer for use in identifying and measuring elemental compositions of semiconductor materials, equipment parts, industrial components, liquid-suspended particles, foods and drugs, and biological samples; Electronic and optical instruments for measuring surfaces; Calibration devices for calibrating the proper performance parameters of x-ray spectrometers used on electron microscopes, used to study the performance of various materials in the industrial and academic areas; Scientific Instruments, namely, optical microscopes, electron microscopes, spectrometers, chromatographs and automated medical assay apparatus for metrology measurement, microstructure imaging, composition analysis, chemical analysis, pathological examination and pathogens detection; Laboratory apparatus and instruments for measuring elemental compositions, namely, x-ray fluorescence spectrometers; Apparatus for preparing and introducing samples into x- ray fluorescence spectrometers; Computer application software for controlling x-ray fluorescence spectrometers and for analyzing spectrometric results, and replacement parts therefor; Optical apparatus and instruments for analyzing material, namely, electron probe micro analyzers, energy-dispersive X- ray fluorescence spectrometers, energy-dispersive X-ray spectrometers, X-ray fluorescence spectrometers; Detectors for analyzing material, namely, X-ray detectors not for medical use, electron dispersive detectors; Measuring or testing machines and instruments, namely, review systems for analyzing or measuring material, namely, wafer defect inspection instruments, pattern measuring instruments; Microscopy diffraction apparatus in the nature of lenses for microscopes; Diffraction apparatus for microscopy not for medical purposes; Containers for microscope slides; Precision instruments for manipulation and positioning of microscopic objects; Prisms; Laboratory equipment, namely, microscope slides; Microtomes; Betatrons; Bio-chips for research or scientific purposes; Electromagnetic coils; X-ray apparatus not for medical purposes; Scientific and technical apparatus, namely, optical Mirrors; Inspection mirrors; Electron tubes; Photoelectric sensors; Optical sensors; Power supplies; Power supplies for electron beam systems; Computer application software for metrology analysis, continues inspection, and series images storing, processing, analyzing and exporting for use in inspection and measurement of semiconductor materials, equipment parts, industrial components, liquid-suspended particles, foods and drugs, and biological samples, in particular for microscopic examination and quality control purposes