TECHNOS

NON-MEDICAL, SCIENTIFIC, LABORATORY AND PRODUCTION DETECTION DEVICES WHICH USE X-RAY REFLECTION FLUORESCENCE ANALYZING TECHNOLOGY AND X-RAY ABSORPTION-EDGE FINE STRUCTURE TECHNOLOGY FOR USE IN THE SEMICONDUCTOR, CATALYST CHEMISTRY, MATERIAL CHEMISTRY AND BIOCHEMISTRY INDUSTRIES WHICH ALLOW THE DETECTION, MEASUREMENT, ANALYSIS AND EVALUATION OF FILM THICKNESS OF PROPERTIES AND METALLIC CONTAMINATION ON WAFER SURFACES