Measuring instruments, namely, machine that measures pattern defects and critical dimensions of semiconductor devices; Electric and magnetic meters; Semiconductor device testers in the nature of semiconductor testing apparatus; Electronic machines and apparatus, namely, semiconductor wafer geometry verification system and structural parts therefor; Semiconductor inspection equipment, namely, optical inspection apparatus for inspection of semiconductor materials, in particular, semiconductor wafers and electron beam semiconductor wafer pattern verification system and structural parts therefor; Inspection equipment for electrical characteristics of semiconductors, namely, optical inspection apparatus for inspection of semiconductor materials, in particular, semiconductor wafers; Electron microscopes; Semi-conductors; Semiconductor testing apparatus
Electrical and Scientific ApparatusInspection services in the fields of semiconductor; Providing information and consultancy in the field of inspection of semiconductor; Consultancy in the field of design of semiconductor
Computer and Scientific