79049775
Jan 17, 2008
Computer hardware and software for designing and manufacturing semiconductor wafers and masks; metrology and inspection tools for measuring, detecting and inspecting chemical compositions, temperature, light images, thickness, flatness, texture, line width and contamination of semiconductor wafers and masks during the manufacturing process
Electrical and Scientific ApparatusServices of technical specialists in the area of metrology; technological services with reference to lithography
Computer and Scientific