76354389
Jan 3, 2002
Aug 24, 2004
Active Trademark
OPTICAL MEASUREMENT AND TEST SYSTEMS COMPRISED OF LASER BEAMS, SCANNERS, SENSOR HEAD, A CONTROLLER, A HIGH-PERFORMANCE PERSONAL COMPUTER WITH OPERATING SYSTEM AND SOFTWARE; ELECTRONIC SPECKLE-PATTERN INTERFEROMETER FOR DEFORMATION AND VIBRATION ANALYSIS, 3-D SCANNER, INTACT TIRE TREAD TESTER; OPTICAL MEASUREMENT SYSTEM FOR TESTING SURFACES COMPRISED OF A GRID PROJECTOR OR LASER SCANNER, SENSORS, CAMERA WITH A CHARGE COUPLED DEVICE (CCD) CHIP OR COMPLEMENTARY METAL OXIDE SEMICONDUCTOR (CMOS) CHIP, PERSONAL COMPUTER WITH OPERATING SYSTEM AND SOFTWARE; OPTICAL TEST SYSTEMS FOR NON-DESTRUCTIVE INSPECTION OF MATERIALS COMPRISED OF LASER INTERFEROMETER, SENSORS, CCD-CHIP CAMERA, AND SOFTWARE; INTERFEROMETERS, NAMELY, HOLOGRAPHIC INTERFEROMETERS AND ELECTRONIC SPECKLE-PATTERN INTERFEROMETERS; DIGITIZERS, NAMELY, 3-D DIGITIZERS; SCANNERS, NAMELY, 3-D SCANNERS; TRICOLITE SYSTEMS COMPRISED OF A LASER BEAM OR A GRID ON A POSITION SENSITIVE DEVICE (PSD) OR ON A CCD OR CMOS CHIP DEVICE TO MEASURE THE 3-D COORDINATES AND DIMENSIONS OF POINTS ON THE SURFACE OF A SAMPLE; OPTICAL SURFACE INSPECTION SYSTEM PRODUCT COMPRISED OF GRID PROJECTOR, CCD-CHIP CAMERA FOR DETECTION AND CLASSIFICATION OF FLAWS ON A SMOOTH SURFACE; OPTICAL 3-D DIGITIZING SCANNING SYSTEM COMPRISED OF SENSORS AND SOFTWARE FOR ACQUIRING AND PROCESSING DATA FOR THE GENERATION OF IMAGES
Electrical and Scientific ApparatusMATERIALS TESTING FOR OTHERS USING DEFORMATION AND VIBRATION ANALYSIS, NON-DESTRUCTIVE TESTING, QUALITY CONTROL FOR OTHERS USING DEFORMATION AND VIBRATION ANALYSIS, NON-DESTRUCTIVE TESTING, AND DIGITAL IMAGING
Computer and Scientific