SPOTWELL

Electronic inspection devices for the detection of defects designed to be used in the field of non-destructive testing applications; electronic inspection devices for the detection of defects in connection with inspection systems using field-programmable gate array technology, phased array technology, ultrasound technology, eddy current technology, and other nondestructive signals and currents; electronic inspection devices to detect defects using ultrasounds, monoprobes, multi-probes, phase network probes, or eddy current probes; electronic inspection devices designed for high-speed ultrasound inspections; electronic enclosures, ultrasound probes, sensor chips and Ultrasonic sensors, all designed to be used for non-destructive testing applications; capacitors, filers, connectors, oscillators, relays, switches, transformers, resistors, semiconductors, integrated circuits and Field-programmable gate array; all designed to be used in the field of non-destructive testing applications; apparatus and instruments for conducting, switching, transforming, accumulating, regulating or controlling the distribution or use of electricity; ultrasonic transmission machines; calculating machines, data processing equipment, computers and downloadable software for non-destructive testing inspections and signal image processing

Engineering services relating to the non-destructive testing field; development of computer software for computer aided design/computer aided manufacturing (CAD/CAM); providing analysis of Full Matrix Capture data; customized design of ultrasonic software; customized design of Total Focusing Method software; providing non-downloadable computer software for analyzing and inspecting products; development of measuring probes for Non Destructive Testing inspections, for ultrasonic applications; development of phased array probe for Total Focusing Method of mono-probes, of multi-probes, of phase network probes, of eddy current probes; providing online non-downloadable software for data processing, non-destructive testing inspections and signal image processing; all of the foregoing services relating to the non-destructive testing field