SPINSAM

Acoustic microscopes and replacement parts therefor; Acoustic inspection and analysis machines for the physical inspection and analysis of microelectronics, microelectromechanical systems (MEMS), and semiconductors; Acoustic semiconductor wafer inspection apparatus; Material testing instruments and machines, namely, acoustic microscopy and acoustic-micro-imaging apparatus for testing microelectronics, microelectromechanical systems (MEMS), and semiconductors; Electronic testing apparatus, not for medical purposes, for testing the physical integrity of microelectronics, microelectromechanical systems (MEMS), and semiconductor wafers; Semiconductor testing apparatus; Semiconductor detectors, namely, inspection devices using acoustic microscopy and acoustic micro-imaging for non-destructive inspection and analysis of possible defects in microelectronics, microelectromechanical systems (MEMS), and semiconductors