Mark Identification

SOLURIS

Serial Number

78272191

Filing Date

Jul 9, 2003

Registration Date

Jan 17, 2006

Trademark by

SOLURIS INC.

Classification Information

Metrology systems for the semiconductor industry comprising automated critical dimension scanning electron microscopes, and optical critical dimension scanning electron microscopes, used in the measurement, development, fabrication and manufacture of state of the art integrated circuits and semiconductor devices

Electrical and Scientific Apparatus

Services in the semiconductor industry, namely, installation, maintenance of metrology systems

Building Construction and Repair