SÄNTIS

Precision measuring apparatus and instruments, namely semiconductor metrology apparatus and instruments in the nature of an optical spectroscopy and surface and sub-surface topography metrology device, quality control apparatus and instruments for use in the testing of semiconductors, and defect identification apparatus and instruments used for detecting defects in semi-conductors; spectroscopes; microscopes; cameras; optical lenses; apparatus for recording images; semi-conductors; all the aforesaid goods are of Swiss origin