SMALLER FASTER SMARTER PROVEN
Mark Identification

SMALLER FASTER SMARTER PROVEN

Serial Number

90836771

Filing Date

Jul 19, 2021

Trademark by

LAM RESEARCH CORPORATION

Classification Information

Components for semiconductor manufacturing machines, namely, electrodes, pedestals in the nature of electro-static chuck pedestals being sensors in the nature of pressure sensors for machine chucks, calibration devices for calibrating pressure sensors, electric actuators, electric measurement sensors, recorded operating software for operating semiconductor manufacturing machines, electrical controllers, transducers in the nature of electrical transducers and electro-optic transducers, electronic signal transmitters, electronic signal receivers, coaxial cables, fiber optic cables, Pressure and optical sensors, vacuums being vacuum gauges, tubes being electron tubes and photoelectric tubes, feed lines being connection cables, power supplies, power cables; Components for semiconductor substrates manufacturing machines, namely, electrodes, pedestals in the nature of electro-static chuck pedestals being sensors in the nature of pressure sensors for machine chucks, calibration devices for calibrating pressure sensors, electric actuators, electric measurement sensors, recorded operating software for operating semiconductor substrates manufacturing machines, electrical controllers, transducers in the nature of electrical transducers and electro-optic transducers, electronic signal transmitters, electronic signal receivers, coaxial cables, fiber optic cables, Pressure and optical sensors, vacuums being vacuum gauges, tubes being electron tubes and photoelectric tubes, feed lines being connection cables, power supplies, power cables; Components for semiconductor wafer processing machines, namely, electrodes, pedestals in the nature of electro-static chuck pedestals being sensors in the nature of pressure sensors for machine chucks, calibration devices for calibrating pressure sensors, electric actuators, electric measurement sensors, recorded operating software for operating semiconductor wafer processing machines, electrical controllers, transducers in the nature of electrical transducers and electro-optic transducers, electronic signal transmitters, electronic signal receivers, coaxial cables, fiber optic cables, Pressure and optical sensors, vacuums being vacuum gauges, tubes being electron tubes and photoelectric tubes, feed lines being connection cables, power supplies, power cables; Components for semiconductor wafer processing equipment, namely, electrodes, pedestals in the nature of electro-static chuck pedestals being sensors in the nature of pressure sensors for machine chucks, calibration devices for calibrating pressure sensors, electric actuators, electric measurement sensors, recorded operating software for operating semiconductor wafer processing equipment, electrical controllers, transducers in the nature of electrical transducers and electro-optic transducers, electronic signal transmitters, electronic signal receivers, coaxial cables, fiber optic cables, Pressure and optical sensors, vacuums being vacuum gauges, tubes being electron tubes and photoelectric tubes, feed lines being connection cables, power supplies, power cables; Computer hardware and recorded software systems for the installation, operation, maintenance, and repair of semiconductor manufacturing machines, semiconductor substrates manufacturing machines, semiconductor wafer processing machines; Downloadable interactive multimedia computer program for the installation, operation, maintenance, and repair of semiconductor manufacturing machines, semiconductor substrates manufacturing machines, semiconductor wafer processing machines; Measurement apparatus and instruments, namely, pressure measuring apparatus, distance measuring apparatus for use in semiconductor manufacturing, semiconductor substrates manufacturing, and semiconductor wafer processing

Electrical and Scientific Apparatus