76235496
Apr 5, 2001
Mar 6, 2007
Contactors and contactor probe cards, made of Micro-Electro-Mechanical Systems (MEMS) material including mechanical elements, sensors, actuators, and electronics on a common silicon substrate, for use in testing equipment to test electronic circuits and electronic devices, namely, semiconductor wafers, integrated circuits, printed circuit boards, semiconductor chips, and packaged semiconductor devices
Electrical and Scientific Apparatus