SICA

Optical inspection apparatus for semi-conductor materials and elements; semiconductor wafer optical inspection apparatus; semiconductor wafer imaging apparatus, namely, optical imaging apparatus for semiconductor wafer; semi-conductor testing machines and instruments; electron microscopes; differential interferometry detectors; testing apparatus not for medical purposes, namely, semiconductor testing apparatus; precision crystallographic measuring apparatus; data sets, downloadable, in the field of semiconductors; computer software, recorded, for operating semiconductor wafer imaging apparatus, namely, optical imaging apparatus for semiconductor wafer; computer software applications, downloadable, for operating semiconductor wafer imaging apparatus, namely, optical imaging apparatus for semiconductor wafer; computer hardware; computer programs, downloadable, for operating semiconductor wafer imaging apparatus, namely, optical imaging apparatus for semiconductor wafer