SEMILAB

Optical and electrical measuring devices for the inspection of semiconductor blocks, semiconductor wafers, semi-finished products of the semiconductor industry, thin-film structures and other microstructures, for determining their physical and chemical properties, namely, layer thickness, hardness, dopant and/or contaminant concentration and electrical conductivity, and for detecting surface irregularities, crystal defects and manufacturing defects, and components of said optical and electrical measuring devices; software for controlling measuring devices, evaluating the measurement results, performing related simulations and controlling manufacturing processes

Documentation, user manuals and technical data sheets of measuring devices used in the semiconductor industry and related areas and of the software related to said measuring devices; teaching materials, printed protocols, brochures and publications relating to said measuring devices and related software

Servicing and maintenance of devices suitable for carrying out optical or electrical measurements on semiconductor blocks, semiconductor wafers, semi-finished products of the semiconductor industry, thin-film structures and other microstructures

Carrying out optical or electrical measurements on semiconductor blocks, semiconductor wafers, semi-finished products of the semiconductor industry, thin-film structures and other microstructures; design and development of devices suitable for carrying out optical or electrical measurements on semiconductor blocks, semiconductor wafers, semi-finished products of the semiconductor industry, thin-film structures and other microstructures; quality control and authentication services related to devices suitable for carrying out optical or electrical measurements on semiconductor blocks, semiconductor wafers, semi-finished products of the semiconductor industry, thin-film structures and other microstructures; design, development and testing of software for controlling measuring devices, evaluating the produced measurement results, performing related simulations and controlling manufacturing processes