SEMES

Machines for automatically cutting and sorting semiconductor elements; machines for automatically cutting semiconductor elements; die bonder machines for manufacturing semiconductor elements; screen printing machines; machines for automatically sealing resin for semiconductor elements; molds in the nature of a machine tool for press machines used in semiconductor manufacturing; wafer stages, namely, a machine for use in manufacturing semiconductors; equipment front end modules for use in automated manufacturing machines for semiconductors; automatic sorting machines for semiconductor elements; picking and placing machines for wafers; flip chip mounting machines for processing semiconductors; machines for transporting semiconductor elements; stocker machines for semiconductor elements distribution; stacker machines for storing front opening unified pod (FOUP) semiconductor wafers; machines for transporting reticle used in semiconductor manufacturing machine; machines for repairing liquid crystal displays using laser; fluorescent material mixing machines for light emitting diodes; machines for cutting light emitting diode devices; machines for cutting and sorting light emitting diode devices; molds in the nature of machine tools for encapsulating emitting diode devices; die bonder machines for manufacturing light emitting diode devices; machines for cutting lead frame of light emitting diodes; molds in the nature of machine tools for machine for cutting lead frame of light emitting diodes; loader for metal oxide chemical vapor deposition machines; diffusion machines for semiconductor wafers; diffusion machines for semiconductor substrates

Machines in the nature of probes for probing semiconductor wafers; machines in the nature of probes for probing semiconductor elements; machines in the nature of probes for probing semiconductor chips; machines in the nature of probes for probing flat display panels; machines in the nature of probes for probing liquid crystal display panels; machines in the nature of probes for probing light emitting diodes; signal connecting apparatus in the nature of probes semiconductor elements probes; signal connecting apparatus in the nature of probes for use with semiconductor wafer elements probing machines; machines in the nature of probes for probing wafer macros, machines in the nature of probes for probing patterns of semiconductor elements; machines in the nature of probes for probing character of liquid crystal displays; automated optical inspection machines and instruments for use in inspecting liquid crystal displays; loader device for use with probes for testing and inspecting liquid crystal displays; unloader device for use with probes for testing and inspecting liquid crystal displays; machines in the nature of probes for probing character of light emitting diodes, light emitting devices for use with probes for use in testing and inspecting light emitting diodes; probe for inspecting character of light emitting diode devices; interface boards for use with probes for inspecting and testing semiconductor elements