SEEING THE LIGHT IN ELECTRONICS

ELECTRONIC LABORATORY AND/OR MANUFACTURING EQUIPMENT FOR USE WITH SEMICONDUCTOR ANALYSIS, NAMELY MICROSCOPES, IMAGE ANALYZERS AND STRUCTURAL PARTS THEREFOR; SEMICONDUCTOR INTEGRATED CIRCUIT INSPECTION EQUIPMENT COMPRISED OF LIGHT COLLECTION OPTICS; PHOTON DETECTORS, FIBER OPTICS, AND COMPUTER HARDWARE AND SOFTWARE; SEMICONDUCTOR WAFER INSPECTION EQUIPMENT COMPRISED OF LIGHT COLLECTION OPTICS, PHOTON DETECTORS, FIBER OPTICS, AND COMPUTER HARDWARE AND SOFTWARE; SEMICONDUCTOR INTEGRATED CIRCUIT TESTING AND DIAGNOSTICS EQUIPMENT COMPRISED OF LIGHT COLLECTION OPTICS, PHOTON DETECTORS, FIBER OPTICS, AND COMPUTER HARDWARE AND SOFTWARE; SEMICONDUCTOR WAFER TESTING EQUIPMENT COMPRISED OF LIGHT COLLECTION OPTICS, PHOTON DETECTORS, FIBER OPTICS AND COMPUTER HARDWARE AND SOFTWARE; COMPUTER HARDWARE AND SOFTWARE FOR THE PURPOSE OF SCANNING, IMAGING, INSPECTING, DIAGNOSING AND TESTING SEMICONDUCTOR WAFERS AND SEMICONDUCTOR INTEGRATED CIRCUITS