87821966
Mar 6, 2018
Jun 25, 2019
KABUSHIKI KAISHA NIHON MICRONICS
Active Trademark
Electrical sockets in the nature of integrated circuit sockets; electrical connectors; electrical and electronic components, namely, plugs; probes for testing semiconductors; electric contacts for semiconductor testers; electrical connectors, namely, probe cards for semiconductor testers; probes for testing apparatus for LCD panels; electric contacts for testing apparatus for LCD panels; electrical connectors, namely, probe cards for testing apparatus for LCD panels; probes for measuring electrical characteristics in apparatus and instruments used in testing electrical components, semiconductors, and LCD panels; electric contacts for measuring apparatus and instruments; electrical connectors, namely, probe cards in the nature of electronic interface cards for measuring apparatus and instruments
Electrical and Scientific Apparatus