SCIOS
Mark Identification

SCIOS

Serial Number

88222800

Filing Date

Dec 10, 2018

Registration Date

Jul 2, 2019

Trademark by

FEI COMPANY

Active Trademark

Classification Information

high brightness, submicron ion and electron beam columns using field emission technology, namely, focused ion beam columns for ion lithography, ion beam milling, secondary ion mass spectroscopy and mask repair; focused electron beam columns for electron beam lithography, electron beam microscopy, and liquid metal ion sources

Electrical and Scientific Apparatus