77505206
Jun 23, 2008
Sep 27, 2011
KABUSHIKI KAISHA HITACHI HIGH-TECHNOLOGIES
Active Trademark
Scanning electron microscopes; semiconductor wafer evaluation and inspection apparatus for use in semiconductor manufacturing and lithography; semiconductor and integrated circuit evaluation and inspection apparatus for use in semiconductor manufacturing, integrated circuit manufacturing, and lithography; software for evaluation and inspection of semiconductors and semiconductor wafers
Electrical and Scientific Apparatus