Computer hardware and downloadable and prerecorded computer software all for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks; imaging metrology tools, namely, scientific and electronic imaging instruments for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits; computer hardware and downloadable and prerecorded computer software for use in managing and controlling the manufacturing process and yield of semiconductors and integrated circuits in the semiconductor, integrated circuit and related microelectronics manufacturing industries; recorded computer software used for event prediction in the manufacturing of semiconductors and integrated circuits
Electrical and Scientific Apparatus