QUATERNITY

Probes for scientific purposes and for use in the measurement and testing of semiconductors; Probe cards for semiconductor testing; Probe cards for integrated circuit testing; Probes for testing integrated circuits; Microscopes

Product research and development; Technological research in the field of microscopy; Engineering services in the field of microscopy or probe or probe card, namely, technical project planning and engineering design services; Technical writing; Measurement analysis of semiconductor components; Measurement analysis of integrated circuits; Measurement analysis of electronic components; Measurement analysis of microelectronic components; Measurement analysis of nano electronic components; Measurement analysis of angstrom electronic components; Measurement analysis of passive and active electronic components; Integrated circuit testing or analysis service; Measurement analysis of very-large-scale integrated circuits; Electronic component testing or analysis service; Research in the area of semiconductor processing technology; Research in the field of physics; Chemical analysis; Chemical research; Material testing and analysis