QP

Scientific, surveying, optical, and measuring apparatus and instruments, namely, scanning probe microscopes, scanning electron microscopes, and atomic force microscopes; apparatus and instruments for conducting, switching, transforming, accumulating, regulating, or controlling electricity, namely, electric conductors, electric switches, electric transformers, electric accumulators, and electric controllers; microscopes and their parts, namely, sensors and probes and component and replacement and consumable parts thereof for non-optical microscopes, scanning near-field optical microscopes, scanning microscopy, scanning probe microscopy, scanning electron microscopy, and atomic force microscopy; micromechanical and microelectromechanical sensor systems, namely, electric sensors; micromechanical and microelectromechanical instruments and apparatus for detecting surfaces and properties of materials; micromechanical strip and diaphragm sensors; scanning instruments and sensors as well as component and replacement parts thereof for determining and measuring surfaces and properties of materials