PUROVISION

Machines for contamination control in semiconductor device manufacturing with integrated recorded software for analyzing data, sold as a unit; Machines for contamination control in semiconductor device manufacturing with integrated recorded software for controlling the machines, sold as a unit; Machines for cleaning of wafer carriers and reticle carriers in semiconductor device manufacturing with integrated recorded software for optimizing cleaning of wafer carriers and reticle carriers, sold as a unit; Machines for contamination control in semiconductor device manufacturing with integrated recorded software for optimizing contamination control, sold as a unit; Machines for semiconductor device manufacturing with integrated recorded operating system software, sold as a unit

Downloadable and recorded software for use in semiconductor device manufacturing; Downloadable and recorded software for use in connection with machines for contamination control in semiconductor device manufacturing; Downloadable and recorded software for controlling machines for contamination control and cleaning of wafer carriers and reticle carriers in semiconductor device manufacturing; Downloadable and recorded software for analyzing data related to contamination control and cleaning of wafer carriers and reticle carriers in semiconductor device manufacturing; Downloadable and recorded software for optimizing contamination control in semiconductor device manufacturing; Downloadable and recorded software for optimizing cleaning of wafer carriers and reticle carriers in semiconductor device manufacturing

Providing non-downloadable software for optimizing contamination control in semiconductor device manufacturing; Providing non-downloadable software for analyzing data related to contamination control and cleaning of wafer carriers and reticle carriers in semiconductor device manufacturing; Providing non-downloadable software for use in semiconductor device manufacturing; Providing non-downloadable software for controlling machines for contamination control and cleaning of wafer carriers and reticle carriers in semiconductor device manufacturing; Providing non-downloadable software for optimizing cleaning of wafer carriers and reticle carriers in semiconductor device manufacturing; Providing non-downloadable software for use in connection with machines for contamination control in semiconductor device manufacturing