PROBING THE FUTURE MJC
Mark Identification

PROBING THE FUTURE MJC

Serial Number

79165700

Filing Date

Jun 23, 2014

Registration Date

Jun 14, 2016

Trademark by

KABUSHIKI KAISHA NIHON MICRONICS

Classification Information

Machines and apparatus for repairing or fixing apparatus for manufacturing solar batteries; apparatus for manufacturing solar batteries

Machinery

electric or magnetic meters and testers, namely, magnetic strength meters and testers; probe cards for use in testing of liquid crystal panels; electric contacts for measuring or testing machines and instruments; parts for electronic or magnetic measuring or testing of machines and instruments; testing machines for integrated circuits or flat panel displays; probe cards for use in testing of integrated circuits or flat panel displays; batteries, electric; accumulators, electric; batteries and electric cells; equipment for testing of electrical characteristics of solar batteries and cells for solar batteries; measuring or testing machines and instruments for use in appearance inspection of wafers for solar batteries and cells for solar batteries; measuring or testing machines and instruments for use in inspection of solar batteries; apparatus for testing of electrical characteristics of semi-conductors; apparatus for testing of liquid crystal display panels; apparatus for measuring semiconductor integrated circuits; apparatus for measuring the electrical properties of liquid crystal display panels; probe cards for use in testing of semi-conductors; apparatus for testing of probe cards

Electrical and Scientific Apparatus

Repair or maintenance of measuring and testing machines and instruments; repair or maintenance of electronic machines and apparatus; repair or maintenance of telecommunication machines and apparatus; installation, repair or maintenance of solar batteries; installation, maintenance and repair of electric batteries; installation, maintenance and repair of electric accumulators; repair or maintenance of apparatus for inspection of electrical characteristics of semiconductors; repair or maintenance of apparatuses for inspecting liquid crystal display panels; repair or maintenance of apparatus for measuring integrated circuits; repair or maintenance of apparatus for measuring liquid crystal display panels; repair or maintenance of electric and magnetic measuring machines and instruments; repair or maintenance of probe cards for use in inspection of semi-conductors; repair or maintenance of probe cards for use in inspection of liquid crystal display panels; repair or maintenance of apparatuses for inspection of probe cards

Building Construction and Repair

Computer software design, computer programming, or maintenance of computer software; design and development of computer programs designed to the specifications of others

Computer and Scientific