PRIMENANO

Scientific electronic testing and measuring instruments and apparatus, namely, microelectromechanical and scanning microwave impedance microscopy devices and parts therefore, for testing and measuring microwave electrical properties and optical imagery systems; microscopes for atomic force microscopy and scanning microwave impedance microscopy; and computer hardware and software for use in conjunction therewith, for testing, assessment, precision measurement and characterization in various applications, namely, microelectronics, ferroelectrics, dopant profiling, failure analysis, thin films, buried charge, graphene, carbon nanotubes, semiconductors, industrial materials, nano materials and other microscopy applications