79053980
Feb 18, 2008
May 12, 2009
Electronic testing apparatus for semiconductor devices, namely, test pins for testing printed circuit boards; electronic testing apparatuses for semiconductor integrated circuit devices, namely, probes for testing integrated circuits; electronic testing sockets for semiconductor devices, namely, test adaptors for testing printed circuit boards; electronic testing probes for semiconductor integrated circuit chips; electronic testing probes for printed circuit boards; electronic testing probes for TAB chips (chips mounted on film wired with copper foil), namely, probes for testing integrated circuits; electronic testing probes for COF chips (chips mounted on copper-plated film), namely probes for testing integrated circuits; electronic testing probes for semiconductor devices, namely, test adaptors for testing printed circuit boards
Electrical and Scientific Apparatus