72148908
Jul 12, 1962
Feb 25, 1964
WAFER TESTING MACHINES, HIGH TEMPERATURE-HIGH VACUUM EQUIPMENT-NAMELY, HIGH TEMPERATURE OVENS AND HIGH VACUUM SYSTEMS DESIGNED TO BE USED INDEPENDENTLY OR AS COMPATIBLE UNITS FOR THE MANUFACTUREE OF TRANSISTORS AND OTHER SIMILAR DELICATE INSTRUMENTS IN THE SEMI-CONDUCTOR INDUSTRY AND IN RESEARCH LABORATORIES, ALIGNMENT MICROSCOPES AND PARTS THEREFOR
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