POWOS

Probe cards used for testing semiconductor, integrated circuit, wafer and chip; Integrated circuit tester; Electronic apparatus and instruments, namely, probes for testing semiconductor, integrated circuit, wafer and chip; Probe cards for testing semiconductor, integrated circuit, wafer and chip; Semiconductor tester for testing semiconductor, integrated circuit, wafer and chip; Mixed integrated circuit automatic tester

Providing custom manufacturing services of probes, probe cards, integrated circuit testers and detectors according to the specifications instructed by customers; Providing custom manufacturing services of probes, probe cards, testers and detectors for semiconductor testing according to the specifications instructed by customers; Providing custom manufacturing services of probes, probe cards, testers and detectors for integrated circuit testing according to the specifications instructed by customers; Providing custom manufacturing services of probes, probe cards, testers and detectors for wafer testing according to the specifications instructed by customers; Providing custom manufacturing services of probes, probe cards, testers and detectors for chip testing according to the specifications instructed by customers

Product research and development (R and D), design of probes, probe cards, integrated circuit testers and detectors, and test software; Technical consulting services for probes, probe cards, integrated circuit testers and detectors, and test software