PIXIRAD
Mark Identification

PIXIRAD

Serial Number

79273398

Filing Date

Sep 30, 2019

Registration Date

Sep 22, 2020

Trademark by

MALVERN PANALYTICAL B.V.

Active Trademark

Classification Information

Scientific, measuring and detecting apparatus and instruments, namely, spectrometers, X-ray fluorescence analysers and spectrometers, diffractometers, X-ray diffractometers and wafer analysers, neutron activation analysers, pulsed fast and thermal neutron activation analysers; X-ray detecting apparatus and instruments; X-ray measuring, detecting and monitoring instruments, indicators and controllers not for medical purposes; X-ray detectors not for medical purposes; analytical apparatus for use in analysing samples of composites for use in scientific, industrial and laboratory applications, namely, X-ray diffraction and spectrometry apparatus, diffractometers, X-ray diffractometers, X-ray analysers, X-ray fluorescence spectrometers, wafer analysers, X-ray tubes; materials characterization apparatus in the nature of scientific and measuring apparatus and instruments, namely, spectrometers, X-ray fluorescence analysers and spectrometers, diffractometers, X-ray diffractometers and wafer analysers; X-ray apparatus not for medical use; analytical, process control and measuring apparatus, namely, reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters; analytical, process control and measuring apparatus, namely, reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters for the cement, steel, aluminium, petrochemicals, industrial minerals, glass and polymers industry, and to customers in research and development institutions; metrology tools, namely, reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters; reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters for both silicon and compound semiconductor applications; X-ray fluorescence wafer and disc analysers, and automated ellipsometers; X-ray fluorescence wafer and disc analysers and automated ellipsometers for the silicon semiconductor industry, for analysing film thickness, composition and density; diffraction apparatus for microscopy; diffraction apparatus and instruments; X-ray diffraction instruments, including X-ray diffraction meters for the compound semiconductor industry; X-ray tubes, not for medical purposes; downloadable or recorded computer software for use in relation to spectrometry; downloadable or recorded computer software for analysis purposes; downloadable or recorded computer software for use in relation to diffractometry; downloadable or recorded computer software for use in relation to X-ray fluorescence analysis; downloadable or recorded computer software for use in relation to the determination of X-ray intensities; downloadable or recorded computer software for use in relation to X-ray diffraction analysis for use with x-ray apparatus not for medical use; component parts and fittings for all the aforesaid goods

Electrical and Scientific Apparatus