PICOPLUS

scanning probe microscopes, namely atomic force microscopes and scanning tunneling microscopes; scanners for use in the field of microscopy; control systems for use in the operation of scanning probe microscopes, comprising a computer workstation and software used to convert information about the properties of a sample, obtained through use of a scanning probe microscope, into data and images viewable on a computer monitor; and temperature control systems for use in microscopy, comprising a microprocessor, pump, heating and cooling element and temperature sensor, for use in maintaining the temperature of an electrochemical cell