PHASCOPE

Scientific, electrical, optical, monitoring and measuring instruments, namely, instruments for measuring the thickness of layers, in particular by eddy current, electromagnetic radiation, magnetic induction and/or coulometric methods, instruments for measuring thickness of coatings, alloy composition, material analysis, [ porosity, electrical conductivity, ferrite content, microhardness, ] phase angles, and other properties of coatings and layers; [ magneto-, opto-electronic data recording media, namely, blank magnetic computer tapes and floppy discs; ] data processors; computers; computer software for use in controlling scientific, electrical, optical, and monitoring parameters of measuring instruments and to analyze and evaluate, transmit and process the results