97717170
Dec 14, 2022
Scanning probe microscopes for semiconductor processing; scanning probe microscopes; magnetic measuring apparatus and instruments used to generate and measure magnetic fields; electron microscopes; precision measuring apparatus for high-resolution measurement of nanometer-sized particles, nanostructures, and surface characteristics, as well as for measuring the particle sizes of semiconductors, nanosensors, and nanostructures; surface roughness testing machines and instruments; microscopes
Electrical and Scientific Apparatus