P900
Mark Identification

P900

Serial Number

99303345

Filing Date

Jul 25, 2025

Trademark by

KLA CORPORATION

Classification Information

Laser scanning semiconductor inspection systems; electronic apparatus for detecting defects on patterned semiconductor wafers; optical inspection systems for use in the manufacturing of integrated circuits, including logic, high-bandwidth memory (HBM), dynamic random-access memory (DRAM), and 3D NAND devices; semiconductor process monitoring instruments; downloadable software for controlling and analyzing data from wafer inspection systems

Electrical and Scientific Apparatus