OSMIC OPTIMIZED

x-ray optical devices, namely, x-ray reflectors, x-ray lenses, x-ray diffractors, x-ray multilayer reflection and defraction surfaces, x-ray crystal reflection and defraction surfaces, x-ray diffractometers, x-ray analysers, and x-ray spectroscopy equipment comprised of an x-ray source, a sample stage, optics, and an x-ray detector, x-ray sources comprised of an x-ray source tube, optics, and collection optics, and kirkpatrick-baez lens system comprised of two or more multilayer reflecting lens elements not for medical use