OPTELICS

Optical inspection apparatus for semi-conductor materials and elements; confocal microscopes; semi-conductor testing machines and instruments; electron microscopes; differential interferometry detectors; testing apparatus not for medical purposes, namely, semiconductor testing apparatus; precision differential Interferometric measuring apparatus; data sets, downloadable, in the field of semiconductors; computer software, recorded, for controlling confocal microscopes; computer software applications, downloadable, for operating confocal microscopes; computer hardware; computer programs, downloadable, for recording images from confocal microscopes